Design for Testability Features of Godson-3 Multicore Microprocessor

doi:10.1007/s11390-011-9437-2

CORC > 计算技术研究所 > 中国科学院计算技术研究所 > 中国科学院计算技术研究所期刊论文 > 英文

	Design for Testability Features of Godson-3 Multicore Microprocessor
	Qi, Zi-Chu 1; Liu, Hui ; Li, Xiang-Ku ; Hu, Wei-Wu
刊名	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
	2011-03-01
卷号	26 期号:2 页码:302-313
关键词	DFT (design for testability) TAM (test access mechanism) multicore processor low power test
ISSN号	1000-9000
DOI	10.1007/s11390-011-9437-2
英文摘要	This paper describes the design for testability (DFT) challenges and techniques of Godson-3 microprocessor, which is a scalable multicore processor based on the scalable mesh of crossbar (SMOC) on-chip network and targets high-end applications. Advanced techniques are adopted to make the DFT design scalable and achieve low-power and low-cost test with limited IO resources. To achieve a scalable and flexible test access, a highly elaborate test access mechanism (TAM) is implemented to support multiple test instructions and test modes. Taking advantage of multiple identical cores embedding in the processor, scan partition and on-chip comparisons are employed to reduce test power and test time. Test compression technique is also utilized to decrease test time. To further reduce test power, clock controlling logics are designed with ability to turn off clocks of non-testing partitions. In addition, scan collars of CACHEs are designed to perform functional test with low-speed ATE for speed-binning purposes, which poses low complexity and has good correlation results.
资助项目	National High-Tech Research and Development 863 Program of China[2008AA010901] ; National High-Tech Research and Development 863 Program of China[2009AA01Z125] ; National High-Tech Research and Development 863 Program of China[2009AA01Z103] ; National Natural Science Foundation of China[60736012] ; National Natural Science Foundation of China[60921002] ; National Natural Science Foundation of China[60803029] ; National Natural Science Foundation of China[61050002] ; National Basic Research 973 Program of China[2005CB321600] ; Important National Science and Technology Specific Projects[2009ZX01028-002-003] ; Important National Science and Technology Specific Projects[2009ZX01029-001-003]
WOS研究方向	Computer Science
语种	英语
出版者	SCIENCE CHINA PRESS
WOS记录号	WOS:000288024900011
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/12625]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Qi, Zi-Chu
作者单位	1.Chinese Acad Sci, Key Lab Comp Syst & Architecture, Beijing 100190, Peoples R China 2.Loongson Technol Corp Ltd, Beijing 100190, Peoples R China 3.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Qi, Zi-Chu,Liu, Hui,Li, Xiang-Ku,et al. Design for Testability Features of Godson-3 Multicore Microprocessor[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2011,26(2):302-313.
APA	Qi, Zi-Chu,Liu, Hui,Li, Xiang-Ku,&Hu, Wei-Wu.(2011).Design for Testability Features of Godson-3 Multicore Microprocessor.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,26(2),302-313.
MLA	Qi, Zi-Chu,et al."Design for Testability Features of Godson-3 Multicore Microprocessor".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 26.2(2011):302-313.