Distance metric learning for pattern recognition

	Distance metric learning for pattern recognition
	Lu, Jiwen 2; Wang, Ruiping 5; Mian, Ajmal 1; Kumar, Ajay 3; Sarkar, Sudeep 4
刊名	PATTERN RECOGNITION
	2018-03-01
卷号	75 页码:1-3
ISSN号	0031-3203
DOI	10.1016/j.patcog.2017.10.032
WOS研究方向	Computer Science ; Engineering
语种	英语
出版者	ELSEVIER SCI LTD
WOS记录号	WOS:000418971900001
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/6267]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Lu, Jiwen
作者单位	1.Univ Western Australia, Sch Comp Sci & Software Engn, Crawley, WA 6009, Australia 2.Tsinghua Univ, Dept Automat, Beijing 100084, Peoples R China 3.Hong Kong Polytech Univ, Dept Comp, Kowloon, Hong Kong, Peoples R China 4.Univ S Florida, Dept Comp Sci & Engn, Tampa, FL 33620 USA 5.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Lu, Jiwen,Wang, Ruiping,Mian, Ajmal,et al. Distance metric learning for pattern recognition[J]. PATTERN RECOGNITION,2018,75:1-3.
APA	Lu, Jiwen,Wang, Ruiping,Mian, Ajmal,Kumar, Ajay,&Sarkar, Sudeep.(2018).Distance metric learning for pattern recognition.PATTERN RECOGNITION,75,1-3.
MLA	Lu, Jiwen,et al."Distance metric learning for pattern recognition".PATTERN RECOGNITION 75(2018):1-3.