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	Interfacial self-assembly of monolayer Mg-doped NiO honeycomb structured thin film with enhanced performance for gas sensing
	Zhao, Yan[1]; Yan, Jia[2]; Huang, Yunpeng[3]; Lian, Jiabiao[4]; Qiu, Jingxia[5]; Bao, Jian[6]; Cheng, Ming[7]; Xu, Hui[8]; Li, Huaming[9]; Chen, Kunlin[10]
刊名	JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
	2018
卷号	29期号:13页码:11498-11508
ISSN号	0957-4522
DOI	http://dx.doi.org/10.1007/s10854-018-9245-3
URL标识	查看原文
收录类别	SCI(E) ; EI
WOS记录号	WOS:000435588600086
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5336186
专题	江苏大学
作者单位	1.[1]Jiangnan Univ, Key Lab Synthet & Biol Colloids, Minist Educ, Wuxi 214122, Peoples R China. 2.Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 3.[2]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 4.[3]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 5.[4]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 6.[5]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 7.[6]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 8.[7]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 9.[8]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China. 10.[9]Jiangsu Univ, Inst Energy Res, Zhenjiang 212013, Peoples R China.
推荐引用方式 GB/T 7714	Zhao, Yan[1],Yan, Jia[2],Huang, Yunpeng[3],et al. Interfacial self-assembly of monolayer Mg-doped NiO honeycomb structured thin film with enhanced performance for gas sensing[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2018,29(13):11498-11508.
APA	Zhao, Yan[1].,Yan, Jia[2].,Huang, Yunpeng[3].,Lian, Jiabiao[4].,Qiu, Jingxia[5].,...&Chen, Kunlin[10].(2018).Interfacial self-assembly of monolayer Mg-doped NiO honeycomb structured thin film with enhanced performance for gas sensing.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,29(13),11498-11508.
MLA	Zhao, Yan[1],et al."Interfacial self-assembly of monolayer Mg-doped NiO honeycomb structured thin film with enhanced performance for gas sensing".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 29.13(2018):11498-11508.

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