Transducer reliability testing
BURLAK, ALEX; BASSAT, LION; KALIFA, ITSHAK; MARGALIT, KFIR; GHANDOUR, MOREES; WEBMAN, ALON; MENTOVICH, ELAD; ROCKMAN, SYLVIE; LANDMAN, EVELYN
2019-02-12
著作权人MELLANOX TECHNOLOGIES, LTD.
专利号US10203366
国家美国
文献子类授权发明
其他题名Transducer reliability testing
英文摘要A transducer reliability testing and VCSEL failure prediction method are provided. The method includes applying a testing temperature and a constant current to a VCSEL for a testing time. The method monitors a forward voltage of the VCSEL and determines if a first change in forward voltage is above a first predetermined threshold over the testing time and if a second change in forward voltage is above a second predetermined threshold over a portion of the testing time. The method determines failure of the VCSEL if either of these predetermined thresholds are exceeded. The method determines passage of the VCSEL if the first change in the forward voltage and the second change in the forward voltage are both below the first predetermined threshold and the second predetermined threshold, respectively.
公开日期2019-02-12
申请日期2016-06-30
状态授权
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/38163]  
专题半导体激光器专利数据库
作者单位MELLANOX TECHNOLOGIES, LTD.
推荐引用方式
GB/T 7714
BURLAK, ALEX,BASSAT, LION,KALIFA, ITSHAK,et al. Transducer reliability testing. US10203366. 2019-02-12.
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