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	High resolution optical microscopy featuring fluorescence transient measurement
	ENDERLEIN, JORG
	2010-10-19
著作权人	PICOQUANT
专利号	US7817269
国家	美国
文献子类	授权发明
其他题名	High resolution optical microscopy featuring fluorescence transient measurement
英文摘要	According to the invention, an excitation layer is focused into a sample and switched on suddenly in order to improve the microscopic resolution; the history of the resulting fluorescence transient is detected and imperatively depending on the excitation intensity, wherein different patterns for the history of different transients are determined for individual excitation intensity values and are matched with the measured transient and the amplitude of the pattern matching the excitation power in the focus is determined and used as a pixel value and the sample scanned in this manner, whereby the spatial resolution is improved to levels lying below the Abbe limit by evaluating the transient.
公开日期	2010-10-19
申请日期	2006-04-28
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/34504]
专题	半导体激光器专利数据库
作者单位	PICOQUANT
推荐引用方式 GB/T 7714	ENDERLEIN, JORG. High resolution optical microscopy featuring fluorescence transient measurement. US7817269. 2010-10-19.

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