Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy

doi:10.1017/S1431927618012436

CORC > 合肥物质科学研究院 > 中国科学院合肥物质科学研究院 > 中科院强磁场科学中心

	Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy
	Hovden, Robert 1,7; Liu, Pengzi 7; Schnitzer, Noah 1; Tsen, Adam W.2; Liu, Yu 6; Lu, Wenjian 6; Sun, Yuping 4,5,6; Kourkoutis, Lena F.3,7
刊名	MICROSCOPY AND MICROANALYSIS
	2018-08-01
卷号	24 期号:4 页码:387-395
关键词	2D materials STEM CBED TaS2 MoS2
ISSN号	1431-9276
DOI	10.1017/S1431927618012436
通讯作者	Hovden, Robert(hovden@umich.edu) ; Kourkoutis, Lena F.(lena.fkourkoutis@cornell.edu)
英文摘要	Layered transition metal dichalcogenides (TMDs) have attracted interest due to their promise for future electronic and optoelectronic technologies. As one approaches the two-dimensional (2D) limit, thickness and local topology can greatly influence the macroscopic properties of a material. To understand the unique behavior of TMDs it is therefore important to identify the number of atomic layers and their stacking in a sample. The goal of this work is to extract the thickness and stacking sequence of TMDs directly by matching experimentally recorded high-angle annular dark-field scanning transmission electron microscope images and convergent-beam electron diffraction (CBED) patterns to quantum mechanical, multislice scattering simulations. Advantageously, CBED approaches do not require a resolved lattice in real space and are capable of neglecting the thickness contribution of amorphous surface layers. Here we demonstrate the crystal thickness can be determined from CBED in exfoliated 1T-TaS2 and 2H-MoS2 to within a single layer for ultrathin less than or similar to 9 layers and +/- 1 atomic layer (or better) in thicker specimens while also revealing information about stacking order-even when the crystal structure is unresolved in real space.
资助项目	PARADIM, as part of the Materials for Innovation Platform Program ; National Science Foundation[DMR-1539918] ; NSF MRSEC program[DMR-1719875] ; Michigan Center for Materials Characterization (MC2) ; Cornell University[NSF-MRI-1429155] ; Weill Institute ; Kavli Institute at Cornell ; National Key Research and Development Program[2016YFA0300404] ; National Nature Science Foundation of China[11674326] ; National Nature Science Foundation of China[11774351]
WOS关键词	TRANSITION-METAL DICHALCOGENIDES ; CHARGE-DENSITY WAVES ; DARK-FIELD STEM ; SINGLE ATOMS ; BILAYER GRAPHENE ; RESOLUTION ; DIFFRACTION ; IMAGES ; SIMULATION ; SCATTERING
WOS研究方向	Materials Science ; Microscopy
语种	英语
出版者	CAMBRIDGE UNIV PRESS
WOS记录号	WOS:000443536200005
资助机构	PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; PARADIM, as part of the Materials for Innovation Platform Program ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; National Science Foundation ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; NSF MRSEC program ; Michigan Center for Materials Characterization (MC2) ; Michigan Center for Materials Characterization (MC2) ; Michigan Center for Materials Characterization (MC2) ; 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内容类型	期刊论文
源URL	[http://ir.hfcas.ac.cn:8080/handle/334002/38582]
专题	合肥物质科学研究院_中科院强磁场科学中心
通讯作者	Hovden, Robert; Kourkoutis, Lena F.
作者单位	1.Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA 2.Univ Waterloo, Dept Chem, Waterloo, ON N2L 3G1, Canada 3.Cornell Nanoscale Sci, Kavli Inst, Ithaca, NY 14853 USA 4.Chinese Acad Sci, High Magnet Field Lab, Hefei 230031, Anhui, Peoples R China 5.Nanjing Univ, Ctr Adv Microstruct, Nanjing 210093, Jiangsu, Peoples R China 6.Chinese Acad Sci, Key Lab Mat Phys, Hefei 230031, Anhui, Peoples R China 7.Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
推荐引用方式 GB/T 7714	Hovden, Robert,Liu, Pengzi,Schnitzer, Noah,et al. Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy[J]. MICROSCOPY AND MICROANALYSIS,2018,24(4):387-395.
APA	Hovden, Robert.,Liu, Pengzi.,Schnitzer, Noah.,Tsen, Adam W..,Liu, Yu.,...&Kourkoutis, Lena F..(2018).Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy.MICROSCOPY AND MICROANALYSIS,24(4),387-395.
MLA	Hovden, Robert,et al."Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy".MICROSCOPY AND MICROANALYSIS 24.4(2018):387-395.