| Study of Carrier Lifetime of Silicon by OPTP Method | |
| Hou, Lei; Shao, Xianjin; Yang, Lei; Wang, Zhiquan; Zhang, Like; Zhao, Mengmeng; Shi, Wei | |
| 2015 | |
| 会议名称 | International Conference on Frontiers in Optical Imaging Technology and Applications / International Symposium on Terahertz Technology and Applications / International Symposium on Surface Topography and Optical Microscopy |
| 会议日期 | 2015-07-23 |
| 会议地点 | PEOPLES R CHINA |
| 关键词 | terahertz waves carrier lifetime OPTP silicon |
| 会议录 | SELECTED PAPERS OF THE PHOTOELECTRONIC TECHNOLOGY
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| URL标识 | 查看原文 |
| WOS记录号 | WOS:000369137800027 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4991335 |
| 专题 | 西安理工大学 |
| 推荐引用方式 GB/T 7714 | Hou, Lei,Shao, Xianjin,Yang, Lei,et al. Study of Carrier Lifetime of Silicon by OPTP Method[C]. 见:International Conference on Frontiers in Optical Imaging Technology and Applications / International Symposium on Terahertz Technology and Applications / International Symposium on Surface Topography and Optical Microscopy. PEOPLES R CHINA. 2015-07-23. |
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