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Microstructure evolution of polycrystalline Ti2AlN MAX phase film during post-deposition annealing
Wang, Tao; Chen, Zhe; Wang, Guoqing; Wang, Lei; Zhang, Guojun
2018
卷号38页码:4892-4898
关键词Ti2AlN MAX phase Thin films Thermal stability
ISSN号0955-2219
DOI10.1016/j.jeurceramsoc.2018.07.028
URL标识查看原文
WOS记录号WOS:000444664300009
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4974251
专题西安理工大学
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GB/T 7714
Wang, Tao,Chen, Zhe,Wang, Guoqing,et al. Microstructure evolution of polycrystalline Ti2AlN MAX phase film during post-deposition annealing[J],2018,38:4892-4898.
APA Wang, Tao,Chen, Zhe,Wang, Guoqing,Wang, Lei,&Zhang, Guojun.(2018).Microstructure evolution of polycrystalline Ti2AlN MAX phase film during post-deposition annealing.,38,4892-4898.
MLA Wang, Tao,et al."Microstructure evolution of polycrystalline Ti2AlN MAX phase film during post-deposition annealing".38(2018):4892-4898.
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