Novel method to examine phase object by the use of TFT-LCD

	Novel method to examine phase object by the use of TFT-LCD
	Guo Rongli ; Yao Baoli(姚保利) ; Han Jun ; Yu Xun ; Nie Liang ; Duan Cunli ; Wang Fan
	2010
会议名称	5th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment
会议日期	2010-04-26
会议地点	dalian, china
页码	76563d
收录类别	EI
会议主办者	the chinese optical society (cos); cas, the institute of optics and electronics (ioe); the society of photo-optical instrumentation engineers (spie)
会议录	proceedings of spie - the international society for optical engineering
会议录出版者	spie
会议录出版地	p.o. box 10, bellingham, wa 98227-0010, united states
学科主题	物理科学和化学
语种	英语
ISBN号	9780819480866
内容类型	会议论文
源URL	[http://ir.opt.ac.cn/handle/181661/11850]
专题	西安光学精密机械研究所_瞬态光学技术国家重点实验室
推荐引用方式 GB/T 7714	Guo Rongli,Yao Baoli,Han Jun,et al. Novel method to examine phase object by the use of TFT-LCD[C]. 见:5th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment. dalian, china. 2010-04-26.