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	Secrecy outage analysis over fluctuating two-ray fading channels
	Zhao, H; Yang, L; Pan, GF; Alouini, MS
刊名	ELECTRONICS LETTERS
	2019
卷号	Vol.55 No.15页码:866-867
关键词	telecommunication network reliability fading channels Monte Carlo methods probability secrecy outage analysis two-ray fading channels secrecy outage probability defined SOP high signal-to-noise ratio region derived expressions probability gap analytical closed-form expression source-to-destination link Monte-Carlo simulations
ISSN号	0013-5194;1350-911X
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4750208
专题	湖南大学
作者单位	1.King Abdullah Univ Sci & Technol, Comp Elect & Math Sci & Engn Div, Thuwal 239556900, Saudi Arabia 2.Hunan Univ, Coll Comp Sci & Elect Engn, Changsha 410082, Hunan, Peoples R China 3.Southwest Univ, Sch Elect & Informat Engn, Chongqing 400715, Peoples R China
推荐引用方式 GB/T 7714	Zhao, H,Yang, L,Pan, GF,et al. Secrecy outage analysis over fluctuating two-ray fading channels[J]. ELECTRONICS LETTERS,2019,Vol.55 No.15:866-867.
APA	Zhao, H,Yang, L,Pan, GF,&Alouini, MS.(2019).Secrecy outage analysis over fluctuating two-ray fading channels.ELECTRONICS LETTERS,Vol.55 No.15,866-867.
MLA	Zhao, H,et al."Secrecy outage analysis over fluctuating two-ray fading channels".ELECTRONICS LETTERS Vol.55 No.15(2019):866-867.

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