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	Analysis of Raman scattering from inclined GeSn/Ge dual-nanowire heterostructure on Ge substrate.
	Han, Delong; Ye, Han; Song, Yuxin; Zhu, Zhongyunshen; Yang, Yuekun; Yu, Zhongyuan; Liu, Yumin; Wang, Shumin; Di, Zengfeng
刊名	Applied Surface Science
	2019
卷号	Vol.463页码:581-586
关键词	RAMAN scattering *GERMANIUM compounds *NANOWIRES *HETEROSTRUCTURES *RAMAN spectroscopy *STRESS relaxation (Mechanics)
ISSN号	0169-4332
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4741631
专题	湖南大学
作者单位	State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing 100876, China
推荐引用方式 GB/T 7714	Han, Delong,Ye, Han,Song, Yuxin,et al. Analysis of Raman scattering from inclined GeSn/Ge dual-nanowire heterostructure on Ge substrate.[J]. Applied Surface Science,2019,Vol.463:581-586.
APA	Han, Delong.,Ye, Han.,Song, Yuxin.,Zhu, Zhongyunshen.,Yang, Yuekun.,...&Di, Zengfeng.(2019).Analysis of Raman scattering from inclined GeSn/Ge dual-nanowire heterostructure on Ge substrate..Applied Surface Science,Vol.463,581-586.
MLA	Han, Delong,et al."Analysis of Raman scattering from inclined GeSn/Ge dual-nanowire heterostructure on Ge substrate.".Applied Surface Science Vol.463(2019):581-586.

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