| Enhancing electromechanical properties of CaBi2Nb2O9 thin films grown on Si | |
| Zhang, Yunxiang; Wang, Chun-Ming; Li, Yao; Cheng, Hongbo; Liu, Menglin; Xue, Caihong; Xu, Huiwen; Ouyang, Jun | |
| 刊名 | CERAMICS INTERNATIONAL
 |
| 2016 | |
| 卷号 | 42期号:15页码:17928-17931 |
| 关键词 | Magnetron sputtering YSZ-buffered Si Electrical properties Strain engineering Bismuth-layer structured ferroelectrics |
| DOI | 10.1016/j.ceramint.2016.08.034 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4703978 |
| 专题 | 山东大学 |
| 作者单位 | Shandong Univ, Sch Mat Sci & Engn, Minist Educ, Key Lab |
| 推荐引用方式 GB/T 7714 | Zhang, Yunxiang,Wang, Chun-Ming,Li, Yao,et al. Enhancing electromechanical properties of CaBi2Nb2O9 thin films grown on Si[J]. CERAMICS INTERNATIONAL,2016,42(15):17928-17931. |
| APA | Zhang, Yunxiang.,Wang, Chun-Ming.,Li, Yao.,Cheng, Hongbo.,Liu, Menglin.,...&Ouyang, Jun.(2016).Enhancing electromechanical properties of CaBi2Nb2O9 thin films grown on Si.CERAMICS INTERNATIONAL,42(15),17928-17931. |
| MLA | Zhang, Yunxiang,et al."Enhancing electromechanical properties of CaBi2Nb2O9 thin films grown on Si".CERAMICS INTERNATIONAL 42.15(2016):17928-17931. |
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