Effect of electrode interfaces on peak-drift switching current of PZT thin films | |
Qicheng Zhang; Wenping Geng; Jing Zhang; Xiaojun Qiao; Xi Chen; Xueming Fan; Xiujian Chou | |
刊名 | Ceramics International |
2019 | |
卷号 | Vol.45 No.3页码:3159-3165 |
关键词 | PZT LaNiO3 electrodes Electrical properties Sol-gel processes |
ISSN号 | 0272-8842 |
URL标识 | 查看原文 |
公开日期 | [db:dc_date_available] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4604169 |
专题 | 湖南大学 |
作者单位 | Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China |
推荐引用方式 GB/T 7714 | Qicheng Zhang,Wenping Geng,Jing Zhang,et al. Effect of electrode interfaces on peak-drift switching current of PZT thin films[J]. Ceramics International,2019,Vol.45 No.3:3159-3165. |
APA | Qicheng Zhang.,Wenping Geng.,Jing Zhang.,Xiaojun Qiao.,Xi Chen.,...&Xiujian Chou.(2019).Effect of electrode interfaces on peak-drift switching current of PZT thin films.Ceramics International,Vol.45 No.3,3159-3165. |
MLA | Qicheng Zhang,et al."Effect of electrode interfaces on peak-drift switching current of PZT thin films".Ceramics International Vol.45 No.3(2019):3159-3165. |
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