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Effect of electrode interfaces on peak-drift switching current of PZT thin films
Qicheng Zhang; Wenping Geng; Jing Zhang; Xiaojun Qiao; Xi Chen; Xueming Fan; Xiujian Chou
刊名Ceramics International
2019
卷号Vol.45 No.3页码:3159-3165
关键词PZT LaNiO3 electrodes Electrical properties Sol-gel processes
ISSN号0272-8842
URL标识查看原文
公开日期[db:dc_date_available]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4604169
专题湖南大学
作者单位Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China
推荐引用方式
GB/T 7714
Qicheng Zhang,Wenping Geng,Jing Zhang,et al. Effect of electrode interfaces on peak-drift switching current of PZT thin films[J]. Ceramics International,2019,Vol.45 No.3:3159-3165.
APA Qicheng Zhang.,Wenping Geng.,Jing Zhang.,Xiaojun Qiao.,Xi Chen.,...&Xiujian Chou.(2019).Effect of electrode interfaces on peak-drift switching current of PZT thin films.Ceramics International,Vol.45 No.3,3159-3165.
MLA Qicheng Zhang,et al."Effect of electrode interfaces on peak-drift switching current of PZT thin films".Ceramics International Vol.45 No.3(2019):3159-3165.
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