Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy

	Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy
	Li, Zhiwei ; Zhang, Biao ; Wang, Jun ; Liu, Jianming ; Liu, Xianglin ; Yang, Shaoyan ; Zhu, Qinsheng ; Wang, Zhanguo
刊名	nanoscale research letters
	2011
卷号	6 页码:1-4
关键词	Conduction bands Photons X ray photoelectron spectroscopy Zinc sulfide
ISSN号	19317573
通讯作者	li, z.(lizhiwei@semi.ac.cn)
学科主题	半导体材料
收录类别	EI
语种	英语
公开日期	2012-06-14
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/23126]
专题	半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式 GB/T 7714	Li, Zhiwei,Zhang, Biao,Wang, Jun,et al. Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy[J]. nanoscale research letters,2011,6:1-4.
APA	Li, Zhiwei.,Zhang, Biao.,Wang, Jun.,Liu, Jianming.,Liu, Xianglin.,...&Wang, Zhanguo.(2011).Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy.nanoscale research letters,6,1-4.
MLA	Li, Zhiwei,et al."Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy".nanoscale research letters 6(2011):1-4.