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	Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure
	Wu, Bin; Zhuang, Shi-Wei; Chi, Chen; Shi, Zhi-Feng; Jiang, Jun-Yan; Chu, Xian-Wei; Dong, Xin; Li, Wan-Cheng; Li, Guo-Xing; Zhang, Yuan-Tao
刊名	SEMICONDUCTOR SCIENCE AND TECHNOLOGY
	2016
卷号	31
关键词	ZnO grain boundary nanorods thin film MOCVD photoluminescence hall effect
ISSN号	0268-1242
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4367136
专题	大连理工大学
作者单位	1.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Qianjin St 2699, Changchun 130012, Peoples R China. 2.Zhengzhou Univ, Dept Phys, Zhengzhou 450052, Peoples R China.,Zhengzhou Univ, Phys Mat Lab, Zhengzhou 450052, Peoples R China. 3.Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Qianjin St 2699, Changchun 130012, Peoples R China. 4.Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116023, Peoples R China.
推荐引用方式 GB/T 7714	Wu, Bin,Zhuang, Shi-Wei,Chi, Chen,et al. Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure[J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2016,31.
APA	Wu, Bin.,Zhuang, Shi-Wei.,Chi, Chen.,Shi, Zhi-Feng.,Jiang, Jun-Yan.,...&Du, Guo-Tong.(2016).Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure.SEMICONDUCTOR SCIENCE AND TECHNOLOGY,31.
MLA	Wu, Bin,et al."Excellent optical quality versus strong grain boundary effect in a double-layer ZnO structure".SEMICONDUCTOR SCIENCE AND TECHNOLOGY 31(2016).

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