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	Fuzzy logic based open-circuit fault diagnosis in IGBT for CMLI fed PMSM drive
	Kuraku, Nagendra Vara Prasad; He, Yigang; Shi, Tiancheng; Gatla, Ranjith Kumar; Yi, Ruan
刊名	Microelectronics Reliability
	2019
卷号	100-101
ISSN号	0026-2714
DOI	10.1016/j.microrel.2019.113415
URL标识	查看原文
收录类别	EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4242490
专题	武汉大学
推荐引用方式 GB/T 7714	Kuraku, Nagendra Vara Prasad,He, Yigang,Shi, Tiancheng,et al. Fuzzy logic based open-circuit fault diagnosis in IGBT for CMLI fed PMSM drive[J]. Microelectronics Reliability,2019,100-101.
APA	Kuraku, Nagendra Vara Prasad,He, Yigang,Shi, Tiancheng,Gatla, Ranjith Kumar,&Yi, Ruan.(2019).Fuzzy logic based open-circuit fault diagnosis in IGBT for CMLI fed PMSM drive.Microelectronics Reliability,100-101.
MLA	Kuraku, Nagendra Vara Prasad,et al."Fuzzy logic based open-circuit fault diagnosis in IGBT for CMLI fed PMSM drive".Microelectronics Reliability 100-101(2019).

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