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Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions from Double-Layered Sastrugi Surfaces
Xu, Peng; Chen, Kun-Shan; Liu, Yu; Shi, Jiancheng; Peng, Chong; Jiang, Rui; Zeng, Jiangyuan
刊名IEEE Transactions on Geoscience and Remote Sensing
2017
卷号55期号:1
ISSN号0196-2892
DOI10.1109/TGRS.2016.2606323
URL标识查看原文
收录类别EI
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4150253
专题武汉大学
推荐引用方式
GB/T 7714
Xu, Peng,Chen, Kun-Shan,Liu, Yu,et al. Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions from Double-Layered Sastrugi Surfaces[J]. IEEE Transactions on Geoscience and Remote Sensing,2017,55(1).
APA Xu, Peng.,Chen, Kun-Shan.,Liu, Yu.,Shi, Jiancheng.,Peng, Chong.,...&Zeng, Jiangyuan.(2017).Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions from Double-Layered Sastrugi Surfaces.IEEE Transactions on Geoscience and Remote Sensing,55(1).
MLA Xu, Peng,et al."Full-Wave Simulation and Analysis of Bistatic Scattering and Polarimetric Emissions from Double-Layered Sastrugi Surfaces".IEEE Transactions on Geoscience and Remote Sensing 55.1(2017).
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