| Development of pore interconnectivity/morphology in porous silica films investigated by cyclic voltammetry and slow positron annihilation spectroscopy | |
| Tang, Xiuqin; Xiong, Bangyun; Li, Qichao; Mao, Wenfeng; Xiao, Wei; Fang, Pengfei; He, Chunqing | |
| 刊名 | ELECTROCHIMICA ACTA
 |
| 2015 | |
| 卷号 | 168 |
| 关键词 | Cyclic voltammetry Porous films Positron annihilation Pore interconnectivity/morphology |
| ISSN号 | 0013-4686 |
| DOI | 10.1016/j.electacta.2015.03.225 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4107266 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Tang, Xiuqin,Xiong, Bangyun,Li, Qichao,et al. Development of pore interconnectivity/morphology in porous silica films investigated by cyclic voltammetry and slow positron annihilation spectroscopy[J]. ELECTROCHIMICA ACTA,2015,168. |
| APA | Tang, Xiuqin.,Xiong, Bangyun.,Li, Qichao.,Mao, Wenfeng.,Xiao, Wei.,...&He, Chunqing.(2015).Development of pore interconnectivity/morphology in porous silica films investigated by cyclic voltammetry and slow positron annihilation spectroscopy.ELECTROCHIMICA ACTA,168. |
| MLA | Tang, Xiuqin,et al."Development of pore interconnectivity/morphology in porous silica films investigated by cyclic voltammetry and slow positron annihilation spectroscopy".ELECTROCHIMICA ACTA 168(2015). |
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