| A Comprehensive Bottom-Tracking Method for Sidescan Sonar Image Influenced by Complicated Measuring Environment | |
| Zhao, Jianhu; Wang, Xiao; Zhang, Hongmei; Wang, Aixue | |
| 刊名 | IEEE JOURNAL OF OCEANIC ENGINEERING
 |
| 2017 | |
| 卷号 | 42期号:3 |
| 关键词 | Bottom tracking complicated measuring environments comprehensive tracking method sidescan sonar (SSS) threshold method |
| ISSN号 | 0364-9059 |
| DOI | 10.1109/JOE.2016.2602642 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4102147 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Zhao, Jianhu,Wang, Xiao,Zhang, Hongmei,et al. A Comprehensive Bottom-Tracking Method for Sidescan Sonar Image Influenced by Complicated Measuring Environment[J]. IEEE JOURNAL OF OCEANIC ENGINEERING,2017,42(3). |
| APA | Zhao, Jianhu,Wang, Xiao,Zhang, Hongmei,&Wang, Aixue.(2017).A Comprehensive Bottom-Tracking Method for Sidescan Sonar Image Influenced by Complicated Measuring Environment.IEEE JOURNAL OF OCEANIC ENGINEERING,42(3). |
| MLA | Zhao, Jianhu,et al."A Comprehensive Bottom-Tracking Method for Sidescan Sonar Image Influenced by Complicated Measuring Environment".IEEE JOURNAL OF OCEANIC ENGINEERING 42.3(2017). |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论