| A wear-leveling-aware dynamic stack for PCM memory in embedded systems | |
| Li, Qingan; He, Yanxiang; Chen, Yong; Xue, Chun Jason; Jiang, Nan; Xu, Chao | |
| 刊名 | Proceedings -Design, Automation and Test in Europe, DATE
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| 2014 | |
| ISSN号 | 1530-1591 |
| DOI | 10.7873/DATE2014.102 |
| URL标识 | 查看原文 |
| 收录类别 | EI |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4053969 |
| 专题 | 武汉大学 |
| 推荐引用方式 GB/T 7714 | Li, Qingan,He, Yanxiang,Chen, Yong,et al. A wear-leveling-aware dynamic stack for PCM memory in embedded systems[J]. Proceedings -Design, Automation and Test in Europe, DATE,2014. |
| APA | Li, Qingan,He, Yanxiang,Chen, Yong,Xue, Chun Jason,Jiang, Nan,&Xu, Chao.(2014).A wear-leveling-aware dynamic stack for PCM memory in embedded systems.Proceedings -Design, Automation and Test in Europe, DATE. |
| MLA | Li, Qingan,et al."A wear-leveling-aware dynamic stack for PCM memory in embedded systems".Proceedings -Design, Automation and Test in Europe, DATE (2014). |
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