N+ plasma-assisted wafer bonding between silicon and chemical vapor deposition oxide at low temperature
Ma, XB ; Liu, WL ; Chen, C ; Xu, JY ; Song, ZT ; Lin, CL
刊名MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
2009
卷号12期号:4-5页码:161-167
关键词ON-INSULATOR MEMS
ISSN号1369-8001
通讯作者Liu, WL, Chinese Acad Sci, Nano Technol Lab, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
学科主题Engineering, Electrical & Electronic; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-24
内容类型期刊论文
源URL[http://ir.sim.ac.cn/handle/331004/94851]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Ma, XB,Liu, WL,Chen, C,et al. N+ plasma-assisted wafer bonding between silicon and chemical vapor deposition oxide at low temperature[J]. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,2009,12(4-5):161-167.
APA Ma, XB,Liu, WL,Chen, C,Xu, JY,Song, ZT,&Lin, CL.(2009).N+ plasma-assisted wafer bonding between silicon and chemical vapor deposition oxide at low temperature.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,12(4-5),161-167.
MLA Ma, XB,et al."N+ plasma-assisted wafer bonding between silicon and chemical vapor deposition oxide at low temperature".MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 12.4-5(2009):161-167.
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