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	Automatic test generation for N-way combinatorial testing
	Shi, Liang; Xu, Baowen; Dong, Guowei; Nie, Changhai
刊名	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
	2005
卷号	3712 LNCS
ISSN号	0302-9743
DOI	10.1007/11558569_15
URL标识	查看原文
收录类别	EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3736559
专题	武汉大学
推荐引用方式 GB/T 7714	Shi, Liang,Xu, Baowen,Dong, Guowei,et al. Automatic test generation for N-way combinatorial testing[J]. Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics),2005,3712 LNCS.
APA	Shi, Liang,Xu, Baowen,Dong, Guowei,&Nie, Changhai.(2005).Automatic test generation for N-way combinatorial testing.Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics),3712 LNCS.
MLA	Shi, Liang,et al."Automatic test generation for N-way combinatorial testing".Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 3712 LNCS(2005).

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