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	Reliability Research of DC Charging Module
	Zeng, Dingjun*; Zhang, Yuanxing; Li, Taoyong; Qi, Mingxuan; Qi, Erjie; Zhu, Guorong
	2017
会议名称	43rd Annual Conference of the IEEE-Industrial-Electronics-Society (IECON)
会议日期	OCT 29-NOV 01, 2017
会议地点	Beijing, PEOPLES R CHINA
关键词	LLC resonant converter lifetime prediction Weibull distribution reliability
页码	7958-7962
会议录	IECON 2017 - 43RD ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY
URL标识	查看原文
ISSN号	1553-572X
WOS记录号	WOS:000427164807132
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/3398035
专题	武汉理工大学
作者单位	1.[Zhu, Guorong 2.Qi, Mingxuan 3.Qi, Erjie 4.Zeng, Dingjun] Wuhan Univ Technol, Sch Automat, Wuhan, Hubei, Peoples R China.
推荐引用方式 GB/T 7714	Zeng, Dingjun*,Zhang, Yuanxing,Li, Taoyong,et al. Reliability Research of DC Charging Module[C]. 见:43rd Annual Conference of the IEEE-Industrial-Electronics-Society (IECON). Beijing, PEOPLES R CHINA. OCT 29-NOV 01, 2017.

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