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	Effect of the modulation ratio on the interface structure of TiAlN/TiN and TiAlN/ZrN multilayers: First-principles and experimental investigations
	Xu, Yu X.; Chen, Li*; Pei, Fei; Chang, Ke K.; Du, Yong*
刊名	Acta Materialia
	2017
卷号	130页码:281-288
关键词	Multilayer thin films First-principles calculation Interface structure Epitaxial growth Hardness
ISSN号	1359-6454
DOI	10.1016/j.actamat.2017.03.053
URL标识	查看原文
WOS记录号	WOS:000401388700025;EI:20171403515211
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3320272
专题	中南大学
作者单位	1.[Chen, Li 2.Du, Yong 3.Xu, Yu X. 4.Chang, Ke K. 5.Pei, Fei] Cent S Univ, State Key Lab Powder Met, Changsha 410083, Hunan, Peoples R China.
推荐引用方式 GB/T 7714	Xu, Yu X.,Chen, Li*,Pei, Fei,et al. Effect of the modulation ratio on the interface structure of TiAlN/TiN and TiAlN/ZrN multilayers: First-principles and experimental investigations[J]. Acta Materialia,2017,130:281-288.
APA	Xu, Yu X.,Chen, Li*,Pei, Fei,Chang, Ke K.,&Du, Yong*.(2017).Effect of the modulation ratio on the interface structure of TiAlN/TiN and TiAlN/ZrN multilayers: First-principles and experimental investigations.Acta Materialia,130,281-288.
MLA	Xu, Yu X.,et al."Effect of the modulation ratio on the interface structure of TiAlN/TiN and TiAlN/ZrN multilayers: First-principles and experimental investigations".Acta Materialia 130(2017):281-288.

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