Nanoscale Wear Layers on Silicon Wafers Induced by Mechanical Chemical Grinding | |
Zhang, Zhenyu; Du, Yuefeng; Wang, Bo; Wang, Ziguang; Kang, Renke; Guo, Dongming | |
刊名 | TRIBOLOGY LETTERS |
2017 | |
卷号 | 65 |
关键词 | Silicon Nanoscale Wear Transmission electron microscopy Grinding |
ISSN号 | 1023-8883 |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3314050 |
专题 | 大连理工大学 |
作者单位 | Dalian Univ Technol, Key Lab Precis & Nontradit Machining Technol, Minist Educ, Dalian 116024, Peoples R China. |
推荐引用方式 GB/T 7714 | Zhang, Zhenyu,Du, Yuefeng,Wang, Bo,et al. Nanoscale Wear Layers on Silicon Wafers Induced by Mechanical Chemical Grinding[J]. TRIBOLOGY LETTERS,2017,65. |
APA | Zhang, Zhenyu,Du, Yuefeng,Wang, Bo,Wang, Ziguang,Kang, Renke,&Guo, Dongming.(2017).Nanoscale Wear Layers on Silicon Wafers Induced by Mechanical Chemical Grinding.TRIBOLOGY LETTERS,65. |
MLA | Zhang, Zhenyu,et al."Nanoscale Wear Layers on Silicon Wafers Induced by Mechanical Chemical Grinding".TRIBOLOGY LETTERS 65(2017). |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论