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	Study on the Partial Discharge Characteristics and Development Process in Use of the Multiple Discharge Patterns for the Typical Defects in Gas-Insulated Switchgear
	Yao, Rui; Si, Gangquan; Zhang, Yanbin; Yuan, Yiwei; Xie, Qian
刊名	CANADIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING-REVUE CANADIENNE DE GENIE ELECTRIQUE ET INFORMATIQUE
	2016
卷号	39期号:[db:dc_citation_issue]页码:297-310
关键词	pattern classification ultrahigh-frequency (UHF) measurements partial discharges (PDs) Gas-insulated switchgear (GIS)
ISSN号	0840-8688
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3224616
专题	西安交通大学
推荐引用方式 GB/T 7714	Yao, Rui,Si, Gangquan,Zhang, Yanbin,et al. Study on the Partial Discharge Characteristics and Development Process in Use of the Multiple Discharge Patterns for the Typical Defects in Gas-Insulated Switchgear[J]. CANADIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING-REVUE CANADIENNE DE GENIE ELECTRIQUE ET INFORMATIQUE,2016,39([db:dc_citation_issue]):297-310.
APA	Yao, Rui,Si, Gangquan,Zhang, Yanbin,Yuan, Yiwei,&Xie, Qian.(2016).Study on the Partial Discharge Characteristics and Development Process in Use of the Multiple Discharge Patterns for the Typical Defects in Gas-Insulated Switchgear.CANADIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING-REVUE CANADIENNE DE GENIE ELECTRIQUE ET INFORMATIQUE,39([db:dc_citation_issue]),297-310.
MLA	Yao, Rui,et al."Study on the Partial Discharge Characteristics and Development Process in Use of the Multiple Discharge Patterns for the Typical Defects in Gas-Insulated Switchgear".CANADIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING-REVUE CANADIENNE DE GENIE ELECTRIQUE ET INFORMATIQUE 39.[db:dc_citation_issue](2016):297-310.

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