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Gallium Nitride Normally-Off Vertical Field-Effect Transistor Featuring an Additional Back Current Blocking Layer Structure
Huang, Huolin; Li, Feiyu; Sun, Zhonghao; Sun, Nan; Zhang, Feng; Cao, Yaqing; Zhang, Hui; Tao, Pengcheng
刊名ELECTRONICS
2019
卷号8
关键词vertical field-effect transistor (VFET) back current blocking layer (BCBL) gallium nitride (GaN) normally off power devices
ISSN号2079-9292
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3217177
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Optoelect Engn & Instrumentat Sci, Dalian 116024, Peoples R China.
2.Dalian Univ Technol, Key Lab Micro Nano Technol & Syst Liaoning Prov, Dalian 116024, Peoples R China.
3.Dalian Univ Technol, Sch Optoelect Engn & Instrumentat Sci, Dalian 116024, Peoples R China.
4.Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, Beijing 100083, Peoples R China.,Chinese Acad Sci, Beijing Key Lab Low Dimens Semicond Mat & Devices, Inst Semicond, Beijing 100083, Peoples R China.
推荐引用方式
GB/T 7714
Huang, Huolin,Li, Feiyu,Sun, Zhonghao,et al. Gallium Nitride Normally-Off Vertical Field-Effect Transistor Featuring an Additional Back Current Blocking Layer Structure[J]. ELECTRONICS,2019,8.
APA Huang, Huolin.,Li, Feiyu.,Sun, Zhonghao.,Sun, Nan.,Zhang, Feng.,...&Tao, Pengcheng.(2019).Gallium Nitride Normally-Off Vertical Field-Effect Transistor Featuring an Additional Back Current Blocking Layer Structure.ELECTRONICS,8.
MLA Huang, Huolin,et al."Gallium Nitride Normally-Off Vertical Field-Effect Transistor Featuring an Additional Back Current Blocking Layer Structure".ELECTRONICS 8(2019).
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