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	Characterization of x-ray imaging crystal spectrometer for high-resolution spatially-resolved x-ray Thomson scattering measurements in shock-compressed experiments
	Lu, J.[1,2]; Hill, K. W.[3]; Bitter, M.[3]; Pablant, N. A.[3]; Delgado-Aparicio, L. F.[3]; Efthimion, P. C.[3]; Lee, H. J.[4]; Zastrau, U.[4,5]
	2017
卷号	187页码:247-254
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3194168
专题	重庆大学
推荐引用方式 GB/T 7714	Lu, J.[1,2],Hill, K. W.[3],Bitter, M.[3],et al. Characterization of x-ray imaging crystal spectrometer for high-resolution spatially-resolved x-ray Thomson scattering measurements in shock-compressed experiments[J],2017,187:247-254.
APA	Lu, J.[1,2].,Hill, K. W.[3].,Bitter, M.[3].,Pablant, N. A.[3].,Delgado-Aparicio, L. F.[3].,...&Zastrau, U.[4,5].(2017).Characterization of x-ray imaging crystal spectrometer for high-resolution spatially-resolved x-ray Thomson scattering measurements in shock-compressed experiments.,187,247-254.
MLA	Lu, J.[1,2],et al."Characterization of x-ray imaging crystal spectrometer for high-resolution spatially-resolved x-ray Thomson scattering measurements in shock-compressed experiments".187(2017):247-254.

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