CORC  > 重庆大学
Tuning the electrical performance of metal oxide thin-film transistors via dielectric interface trap passivation and graded channel modulation doping
Wu, Zhiheng[1]; Yao, Zhiqiang[1]; Liu, Suilin[2]; Yuan, Bin[1]; Zhang, Yake[1]; Liang, Yu[1]; Wang, Zhuo[1]; Tang, Xiaosheng[3]; Shao, Guosheng[1]
2017
卷号5页码:1206-1215
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3178807
专题重庆大学
推荐引用方式
GB/T 7714
Wu, Zhiheng[1],Yao, Zhiqiang[1],Liu, Suilin[2],et al. Tuning the electrical performance of metal oxide thin-film transistors via dielectric interface trap passivation and graded channel modulation doping[J],2017,5:1206-1215.
APA Wu, Zhiheng[1].,Yao, Zhiqiang[1].,Liu, Suilin[2].,Yuan, Bin[1].,Zhang, Yake[1].,...&Shao, Guosheng[1].(2017).Tuning the electrical performance of metal oxide thin-film transistors via dielectric interface trap passivation and graded channel modulation doping.,5,1206-1215.
MLA Wu, Zhiheng[1],et al."Tuning the electrical performance of metal oxide thin-film transistors via dielectric interface trap passivation and graded channel modulation doping".5(2017):1206-1215.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace