Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing | |
ZHOU Zhimin; Yong ZHOU; Zhang TH(张泰华) | |
刊名 | Journal of Materials Science & Technology |
2006 | |
通讯作者邮箱 | yzhou@sjtu.edu.cn |
卷号 | 22期号:3页码:345-348 |
ISSN号 | 1005-0302 |
通讯作者 | Zhou, Y (reprint author), Shanghai Jiao Tong Univ, Key Lab Thin Film & Microfabricat Technol, Minist Educ, Res Inst Micro Nanometer Sci & Technol, Shanghai 200030, Peoples R China. |
中文摘要 | Microbridge testing was used to measure the Young's modulus and residual stress of metallic films. Samples of freestanding NiFe film microbridge were fabricated by microelectromechanical systems. Special ceramic shaft structure was designed to solve the problem of getting the load-deflection curve of NiFe film microbridge by the Nanoindenter XP system with normal Berkovich probe. Theoretical analysis of load-deflection curves of the microbridges was proposed to evaluate the Young's modulus and residual stress of the films simultaneously. The calculated results based on experimental measurements show that the average Young's modulus and residual stress for the electroplated NiFe films are 203.2 GPa and 333.0 MlPa, respectively, while the Young's modulus measured by the Nano-hardness method is 209.6 +/- 11.8 GPa for the thick NiFe film with silicon substrate. |
学科主题 | 力学 |
类目[WOS] | Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering |
研究领域[WOS] | Materials Science ; Metallurgy & Metallurgical Engineering |
关键词[WOS] | THIN-FILMS ; MECHANICAL-PROPERTIES ; PLATED PERMALLOY ; MEMS MATERIALS ; STRENGTH ; SILICON |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000238133800015 |
公开日期 | 2007-06-15 ; 2007-12-05 ; 2009-06-23 |
内容类型 | 期刊论文 |
源URL | [http://dspace.imech.ac.cn/handle/311007/15329] |
专题 | 力学研究所_力学所知识产出(1956-2008) |
推荐引用方式 GB/T 7714 | ZHOU Zhimin,Yong ZHOU,Zhang TH. Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing[J]. Journal of Materials Science & Technology,2006,22(3):345-348. |
APA | ZHOU Zhimin,Yong ZHOU,&张泰华.(2006).Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing.Journal of Materials Science & Technology,22(3),345-348. |
MLA | ZHOU Zhimin,et al."Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing".Journal of Materials Science & Technology 22.3(2006):345-348. |
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