| Measurement of excited layer thickness in highly photo-excited GaAs | |
| Liang, Lingliang; Tian, Jinshou; Wang, Tao; Wu, Shengli; Li, Fuli; Gao, Guilong | |
| 2016 | |
| 关键词 | Optical beam deflection Refractive index change Photo-excited layer Pump-probe |
| 卷号 | 10155 |
| 会议录 | OPTICAL MEASUREMENT TECHNOLOGY AND INSTRUMENTATION
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| URL标识 | 查看原文 |
| ISSN号 | 0277-786X |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2951866 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Liang, Lingliang,Tian, Jinshou,Wang, Tao,et al. Measurement of excited layer thickness in highly photo-excited GaAs[C]. 见:. |
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