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	A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
	Ceng CB(曾传滨); Zhao FZ(赵发展); Yan WW(闫薇薇)
刊名	Nuclear Instruments and Methods in Physics Research B
	2017-09-15
文献子类	期刊论文
内容类型	期刊论文
源URL	[http://159.226.55.106/handle/172511/18029]
专题	微电子研究所_硅器件与集成研发中心
推荐引用方式 GB/T 7714	Ceng CB,Zhao FZ,Yan WW. A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM[J]. Nuclear Instruments and Methods in Physics Research B,2017.
APA	曾传滨,赵发展,&闫薇薇.(2017).A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM.Nuclear Instruments and Methods in Physics Research B.
MLA	曾传滨,et al."A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM".Nuclear Instruments and Methods in Physics Research B (2017).

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