Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source | |
Cao, Y; Sun, LT; Ma, L; Ma, BH; Wang, H; Feng, YC; Li, JY; Zhao, HW; Zhang, ZM; Zhang, XZ | |
2006-03 | |
卷号 | 77 |
期号 | 3 |
DOI | 10.1063/1.2172357 |
英文摘要 | With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modem Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article. (c) 2006 American Institute of Physics. |
会议录 | REVIEW OF SCIENTIFIC INSTRUMENTS |
会议录出版者 | AMER INST PHYSICS |
会议录出版地 | CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA |
语种 | 英语 |
WOS研究方向 | Instruments & Instrumentation ; Physics |
WOS记录号 | WOS:000237473200047 |
内容类型 | 会议论文 |
源URL | [http://119.78.100.186/handle/113462/57982] |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Cao, Y |
作者单位 | Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansuo, Peoples R China |
推荐引用方式 GB/T 7714 | Cao, Y,Sun, LT,Ma, L,et al. Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source[C]. 见:. |
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