CORC  > 西安交通大学
Investigation of Vacuum Gap Breakdown under Microsecond Pulses
Qiu, Xu-dong; Su, Jian-cang; Zhang, Yu; Zeng, Bo; Li, Mei; Cheng, Jie; Zhao, Liang; Xu, Xiu-dong; Yu, Bin-xiong; Li, Rui
刊名IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
2018
卷号25页码:2040-2048
关键词vacuum breakdown cathode plasma field-induced electron emission anode material discharge current
ISSN号1070-9878
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2835695
专题西安交通大学
推荐引用方式
GB/T 7714
Qiu, Xu-dong,Su, Jian-cang,Zhang, Yu,et al. Investigation of Vacuum Gap Breakdown under Microsecond Pulses[J]. IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,2018,25:2040-2048.
APA Qiu, Xu-dong.,Su, Jian-cang.,Zhang, Yu.,Zeng, Bo.,Li, Mei.,...&Li, Rui.(2018).Investigation of Vacuum Gap Breakdown under Microsecond Pulses.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,25,2040-2048.
MLA Qiu, Xu-dong,et al."Investigation of Vacuum Gap Breakdown under Microsecond Pulses".IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 25(2018):2040-2048.
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