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	Orientation effect in Ar dimer fragmentation by highly charged ion impact
	Zhu, X. L.; Yan, S.; Feng, W. T.; Ma, X.; Chuai, X. Y.; Guo, D. L.; Gao, Y.; Zhang, R. T.; Zhang, P.; Zhang, S. F.
刊名	JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
	2018
卷号	51
关键词	highly charged ions Ar dimer orientation effect reaction microscope fragmentation mechanism
ISSN号	0953-4075
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2831656
专题	西安交通大学
推荐引用方式 GB/T 7714	Zhu, X. L.,Yan, S.,Feng, W. T.,et al. Orientation effect in Ar dimer fragmentation by highly charged ion impact[J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS,2018,51.
APA	Zhu, X. L..,Yan, S..,Feng, W. T..,Ma, X..,Chuai, X. Y..,...&Qian, D. B..(2018).Orientation effect in Ar dimer fragmentation by highly charged ion impact.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS,51.
MLA	Zhu, X. L.,et al."Orientation effect in Ar dimer fragmentation by highly charged ion impact".JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS 51(2018).

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