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	Vulnerability Assessment of a Multistate Component for IEMI Based on a Bayesian Method
	Liu, Yu; Han, Feng; Wang, Jianguo; Qi, Hongxin
刊名	IEEE Transactions on Electromagnetic Compatibility
	2019
卷号	61页码:467-475
关键词	Assessment Bayes methods Bayesian method Degradation Estimation multistate component (MSC) Probability density function Reliability theory vulnerability vulnerability distribution
ISSN号	0018-9375
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2828001
专题	西安交通大学
推荐引用方式 GB/T 7714	Liu, Yu,Han, Feng,Wang, Jianguo,et al. Vulnerability Assessment of a Multistate Component for IEMI Based on a Bayesian Method[J]. IEEE Transactions on Electromagnetic Compatibility,2019,61:467-475.
APA	Liu, Yu,Han, Feng,Wang, Jianguo,&Qi, Hongxin.(2019).Vulnerability Assessment of a Multistate Component for IEMI Based on a Bayesian Method.IEEE Transactions on Electromagnetic Compatibility,61,467-475.
MLA	Liu, Yu,et al."Vulnerability Assessment of a Multistate Component for IEMI Based on a Bayesian Method".IEEE Transactions on Electromagnetic Compatibility 61(2019):467-475.

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