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	A Novel Low-leakage Power-rail ESD Clamp Circuit with Adjustable Triggering Voltage and Superior False-triggering Immunity for Nanoscale Applications
	Lu, Guangyi ; Wang, Yuan ; Cao, Jian ; Jia, Song ; Zhang, Xing
	2016
关键词	Electrostatic discharge (ESD) detection circuit triggering voltage (V-t1) leakage current (I-leak) transmission line pulsing (TLP) test PROTECTION DESIGN
英文摘要	This work presents a novel power-rail electrostatic discharge (ESD) clamp circuit for nanoscale applications. By skillfully incorporating transient and static ESD detection mechanisms into its detection circuit, the proposed circuit achieves a wide range of adjustable triggering voltage (V-t1) while maintaining low standby leakage current (I-leak). Besides, the proposed circuit achieves significantly-improved false-triggering immunity compared with the transient-triggered circuit. All investigated circuits are fabricated in a 65-nm CMOS process. Simulation and test results have both confirmed the superiority of the proposed circuit. In addition, the proposed circuit achieves similar triggering behaviors in both transmission line pulsing (TLP) and very fast TLP (VF-TLP) tests.; CPCI-S(ISTP); wangyuan@pku.edu.cn; 265-268
语种	英语
出处	IEEE International Symposium on Circuits and Systems (ISCAS)
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/459954]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Lu, Guangyi,Wang, Yuan,Cao, Jian,et al. A Novel Low-leakage Power-rail ESD Clamp Circuit with Adjustable Triggering Voltage and Superior False-triggering Immunity for Nanoscale Applications. 2016-01-01.

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