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	Rapid Design Space Exploration of Two-level Unified Caches
	Deng, Jingyu ; Liang, Yun ; Luo, Guojie ; Sun, Guangyu
	2014
英文摘要	Modern application specific system-on-chip platforms allow customization of caches. Such flexibility enables the designers to identify the suitable cache configurations through design space exploration of caches. Trace-driven simulation is widely used to obtain the cache hits and misses for design space exploration. However, simulation is normally slow. Meanwhile, as the embedded system moves toward cache hierarchies with multi-level caches, such expanded design space leads to extremely long simulation time. In this paper, we propose a rapid design space exploration technique for two-level unified caches. Given the application trace, our technique determines the cache hits and misses for multiple cache configurations in a single pass. Our exploration technique adopts a novel LRU linked list data structure, lookup tables, and search algorithms to effectively improve the exploration time. Experimental results indicate that our analysis is 7-239X times faster compared to the fastest known design space exploration technique, in estimating cache hits and misses for popular embedded benchmarks.; Engineering, Electrical & Electronic; EI; CPCI-S(ISTP); 0
语种	英语
DOI标识	10.1109/ISCAS.2014.6865540
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/405614]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Deng, Jingyu,Liang, Yun,Luo, Guojie,et al. Rapid Design Space Exploration of Two-level Unified Caches. 2014-01-01.

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