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	A New Type Silicon Drift Detector with Curved Surface
	Cai, Lu ; Yu, Min ; Tian, Dayu ; Wang, Jinyan ; Jin, Yufeng
	2011
关键词	Silicon drift detector (SDD) punch-through
英文摘要	A new Silicon Drift Detector (SDD) with curved surface has been proposed and analyzed by simulation. The adjacent drift cathodes punch-through problem in traditional SDD has been eliminated in the novel SDD. The potential distribution and advantages of this new SDD in comparison with the normal one are presented and discussed in this paper.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000297572400050&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Instruments & Instrumentation; Optics; Imaging Science & Photographic Technology; EI; CPCI-S(ISTP); 0
语种	英语
DOI标识	10.1117/12.900684
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/293159]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Cai, Lu,Yu, Min,Tian, Dayu,et al. A New Type Silicon Drift Detector with Curved Surface. 2011-01-01.

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