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	The anti-reflection lens: Quantitatively far-field imaging beyond the Rayleigh limit
	Li, Lianlin ; Li, Fang
	2014
英文摘要	This study reports an novel approach to reconstruct quantitatively the electrical parameters of imaged specimen with sub-wavelength resolution. This super-resolution imaging methodology relies on the use of anti-reflection lens with the property of zero (strictly, approximately zero) backward propagation. We demonstrate theoretically and numerically that the anti-reflection lenses can encode the subtle information of imaged specimen into far field, and thus support the quantitative reconstruction of probed objects in the sub-wavelength resolution from far-field measurements merely by solving a well-conditioned linear inverse problem. The proposed approach is not only confined to weakly- but also suitable for generally- scattering cases. The operational principle of constructing the anti-reflection lens that is achievable with current experimental technique is provided as well. This new approach will be a breakthrough in the spatio-temporal control of field (or light) with the potential of being applied in nanolithography, detection, sensing or sub-wavelength imaging in the near future. ? 2014 IEEE.; EI; 0
语种	英语
DOI标识	10.1109/URSIGASS.2014.6929055
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/263041]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Li, Lianlin,Li, Fang. The anti-reflection lens: Quantitatively far-field imaging beyond the Rayleigh limit. 2014-01-01.

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