An iterative refinement method combining detector geometry optimization and diffraction model refinement in serial femtosecond crystallography
Dong, Yuhui; Geng, Zhi, Hu, Menglu, She, Zhun, Zhou, Qiang, Gao, Zengqiang; Dong YH(董宇辉); Gao ZQ(高增强); Zhou Q(周强); She Z(佘准); Hu ML(胡梦璐); Geng Z(耿直)
刊名RADIATION DETECTION TECHNOLOGY AND METHODS
2018
卷号2018期号: 1页码: 28
ISSN号2509-9930
DOI10.1007/s41605-017-0034-y
文献子类Article
英文摘要Recent advances in serial femtosecond crystallography (SFX) using X-ray free electron lasers (XFELs) have facilitated accurate structure determination for biological macromolecules. However, given the many fluctuations inherent in SFX, the acquisition of SFX data of sufficiently high quality still remains challenging.
电子版国际标准刊号2509-9949
语种英语
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/286764]  
专题高能物理研究所_多学科研究中心
通讯作者Dong YH(董宇辉)
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Dong, Yuhui,Geng, Zhi, Hu, Menglu, She, Zhun, Zhou, Qiang, Gao, Zengqiang,Dong YH,et al. An iterative refinement method combining detector geometry optimization and diffraction model refinement in serial femtosecond crystallography[J]. RADIATION DETECTION TECHNOLOGY AND METHODS,2018,2018( 1): 28.
APA Dong, Yuhui.,Geng, Zhi, Hu, Menglu, She, Zhun, Zhou, Qiang, Gao, Zengqiang.,董宇辉.,高增强.,周强.,...&耿直.(2018).An iterative refinement method combining detector geometry optimization and diffraction model refinement in serial femtosecond crystallography.RADIATION DETECTION TECHNOLOGY AND METHODS,2018( 1), 28.
MLA Dong, Yuhui,et al."An iterative refinement method combining detector geometry optimization and diffraction model refinement in serial femtosecond crystallography".RADIATION DETECTION TECHNOLOGY AND METHODS 2018. 1(2018): 28.
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