Evaluation of growth characteristics of Aspergillus parasiticus inoculated in different culture media by shortwave infrared (SWIR) hyperspectral imaging
Chu, Xuan; Wang, Wei; Ni, Xinzhi; Zheng, Haitao; Zhao, Xin; Zhuang, Hong; Lawrence, Kurt C.; Li, Chunyang; Li, Yufeng; Lu, Chengjun
刊名JOURNAL OF INNOVATIVE OPTICAL HEALTH SCIENCES
2018
卷号11期号:5页码:1850031
关键词Aspergillus parasiticus growth characteristics characteristic wavelengths shortwave infrared (SWIR) hyperspectral imaging
ISSN号1793-5458
DOI10.1142/S1793545818500311
文献子类Article
英文摘要The growth characteristics of Aspergillus parasiticus incubated on two culture media were examined using shortwave infrared (SWIR, 1000-2500 nm) hyperspectral imaging (HSI) in this work. HSI images of the A. parasiticus colonies growing on rose bengal medium (RBM) and maize agar medium (MAM) were recorded daily for 6 days. The growth phases of A. parasiticus were indicated through the pixel number and average spectra of colonies. On score plot of the first principal component (PC1) and PC2, four growth zones with varying mycelium densities were identified. Eight characteristic wavelengths (1095, 1145, 1195, 1279, 1442, 1655, 1834 and 1929 nm) were selected from PC1 loading, average spectra of each colony as well as each growth zone. Furthermore, support vector machine (SVM) classifier based on the eight wavelengths was built, and the classification accuracies for the four zones (from outer to inner zones) on the colonies on RBM were 99.77%, 99.35%, 99.75% and 99.60% and 99.77%, 99.39%, 99.31% and 98.22% for colonies on MAM. In addition, a new score plot of PC2 and PC3 was used to differentiate the colonies incubated on RBM and MAM for 6 days. Then characteristic wavelengths of 1067, 1195, 1279, 1369, 1459, 1694, 1834 and 1929 nm were selected from the loading of PC2 and PC3. Based on them, a new SVM model was developed to differentiate colonies on RBM and MAM with accuracy of 100.00% and 99.99%, respectively. In conclusion, SWIR hyperspectral image is a powerful tool for evaluation of growth characteristics of A. parasiticus incubated in different culture
电子版国际标准刊号1793-7205
WOS关键词SOLID SUBSTRATE ; FUSARIUM ; NIDULANS ; KERNELS ; FUNGI ; CLASSIFICATION ; BACTERIA ; STRAINS ; COLONY ; IMAGES
WOS研究方向Science & Technology - Other Topics
语种英语
WOS记录号WOS:000448645500008
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/286637]  
专题高能物理研究所_实验物理中心
高能物理研究所_多学科研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Chu, Xuan,Wang, Wei,Ni, Xinzhi,et al. Evaluation of growth characteristics of Aspergillus parasiticus inoculated in different culture media by shortwave infrared (SWIR) hyperspectral imaging[J]. JOURNAL OF INNOVATIVE OPTICAL HEALTH SCIENCES,2018,11(5):1850031.
APA Chu, Xuan.,Wang, Wei.,Ni, Xinzhi.,Zheng, Haitao.,Zhao, Xin.,...&李玉锋.(2018).Evaluation of growth characteristics of Aspergillus parasiticus inoculated in different culture media by shortwave infrared (SWIR) hyperspectral imaging.JOURNAL OF INNOVATIVE OPTICAL HEALTH SCIENCES,11(5),1850031.
MLA Chu, Xuan,et al."Evaluation of growth characteristics of Aspergillus parasiticus inoculated in different culture media by shortwave infrared (SWIR) hyperspectral imaging".JOURNAL OF INNOVATIVE OPTICAL HEALTH SCIENCES 11.5(2018):1850031.
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