Studies of photosensitive alignment layer based on ladder-like polysilsequioxane liquid-crystal devices using atomic force microscopy/force curve

doi:10.1002/sia.1555

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	Studies of photosensitive alignment layer based on ladder-like polysilsequioxane liquid-crystal devices using atomic force microscopy/force curve
	Zhu, CF; Shang, GY; Li, BS; Wang, C; Cui, L; Xie, P; Zhang, RB
刊名	SURFACE AND INTERFACE ANALYSIS
	2003-05-01
卷号	35 期号:5 页码:459-462
关键词	Photosensitive Thin Film Adhesion Force
ISSN号	0142-2421
DOI	10.1002/sia.1555
英文摘要	Atomic force microscopy (AFM)/force curve measurements were used to study the photochemical process of UV-treated (0, 10, 20, 30 and 60 min) organic thin films that were prepared from azobenzene and cinnamate side-chain co-grafted ladder-like polysilsequioxanes (LPS). The morphological data of the thin films describe the changing process on the surface of the thin film. The statistical results of the adhesion force of the thin films further demonstrate the intermolecular characteristics of the thin films. A photosensitive thin film after UV exposure for 20 min would be a better material with a preferred orientation that can be used to make liquid-crystal devices. Copyright (C) 2003 John Wiley Sons, Ltd.
语种	英语
出版者	JOHN WILEY & SONS LTD
WOS记录号	WOS:000182909700008
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/79725]
专题	中国科学院化学研究所
通讯作者	Wang, C
作者单位	Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Zhu, CF,Shang, GY,Li, BS,et al. Studies of photosensitive alignment layer based on ladder-like polysilsequioxane liquid-crystal devices using atomic force microscopy/force curve[J]. SURFACE AND INTERFACE ANALYSIS,2003,35(5):459-462.
APA	Zhu, CF.,Shang, GY.,Li, BS.,Wang, C.,Cui, L.,...&Zhang, RB.(2003).Studies of photosensitive alignment layer based on ladder-like polysilsequioxane liquid-crystal devices using atomic force microscopy/force curve.SURFACE AND INTERFACE ANALYSIS,35(5),459-462.
MLA	Zhu, CF,et al."Studies of photosensitive alignment layer based on ladder-like polysilsequioxane liquid-crystal devices using atomic force microscopy/force curve".SURFACE AND INTERFACE ANALYSIS 35.5(2003):459-462.