Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation

	Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation
	Xu, Yuchen; Gu, Lixin; Li, Yang; Mo, Bing; Lin, Yangting
	2019
会议日期	JUL 07-12, 2019
会议地点	Sapporo, JAPAN
会议录	METEORITICS & PLANETARY SCIENCE
ISSN号	1086-9379
内容类型	会议论文
源URL	[http://ir.nssc.ac.cn/handle/122/7081]
专题	国家空间科学中心_空间科学部
推荐引用方式 GB/T 7714	Xu, Yuchen,Gu, Lixin,Li, Yang,et al. Focused Ion Beam (FIB) and Microtome Combined Ultrathin Slice Preparation for Transmission Electron Microscopy (TEM) Observation[C]. 见:. Sapporo, JAPAN. JUL 07-12, 2019.