Signal detection techniques for scattering-type scanning near-field optical microscopy

doi:10.1080/05704928.2018.1443275

	Signal detection techniques for scattering-type scanning near-field optical microscopy
	Dai, Guangbin 1,2; Yang, Zhongbo2 ; Geng, Guoshuai 1,2; Li, Mingliang 1; Chang, Tianying 1,2; Wei, Dongshan 2; Du, Chunlei2 ; Cui, Hong-Liang1,2 ; Wang, Huabin2,3
刊名	Applied Spectroscopy Reviews
	2018
卷号	53 期号:10 页码:806-835
ISSN号	05704928
DOI	10.1080/05704928.2018.1443275
英文摘要	Scattering-type scanning near-field optical microscopy (s-SNOM) has been playing more and more important roles in investigating electromagnetic properties of various materials and structures on the nanoscale. In this technique, a sharp tip is employed as the near-field antenna to measure the sample's properties with a high spatial resolution. As the scattered near-field signal from the tip is extremely weak and contaminated by strong background noise, the effective detection, and subsequent extraction of the near-field information from the detected signals is the key issue for s-SNOM. In this review, we give a systematic explanation of the underlying mechanisms of s-SNOM, and summarize and interpret major signal detection techniques involved, including experimental setups, theories for signal analysis and processing, and exposition of advantages and disadvantages of such techniques. By this, we hope to provide a practical guide and a go-to source of detailed information for those interested in and/or working on s-SNOM. © 2018, © 2018 Taylor & Francis Group, LLC.
电子版国际标准刊号	1520569X
语种	英语
内容类型	期刊论文
源URL	[http://119.78.100.138/handle/2HOD01W0/8024]
专题	中国科学院重庆绿色智能技术研究院
作者单位	1.College of Instrumentation and Electrical Engineering, Jilin University, Changchun; Jilin, China; 2.Chongqing Engineering Research Center of High-Resolution and Three-Dimensional Dynamic Imaging Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing, China; 3.Key Laboratory of Interfacial Physics and Technology, Chinese Academy of Sciences, Shanghai, China
推荐引用方式 GB/T 7714	Dai, Guangbin,Yang, Zhongbo,Geng, Guoshuai,et al. Signal detection techniques for scattering-type scanning near-field optical microscopy[J]. Applied Spectroscopy Reviews,2018,53(10):806-835.
APA	Dai, Guangbin.,Yang, Zhongbo.,Geng, Guoshuai.,Li, Mingliang.,Chang, Tianying.,...&Wang, Huabin.(2018).Signal detection techniques for scattering-type scanning near-field optical microscopy.Applied Spectroscopy Reviews,53(10),806-835.
MLA	Dai, Guangbin,et al."Signal detection techniques for scattering-type scanning near-field optical microscopy".Applied Spectroscopy Reviews 53.10(2018):806-835.