High contrast ratio, high uniformity multiple quantum well spatial light modulators
Huang Yuyang ; Liu H C ; Wasilewski Z R ; Buchanan M ; Laframboise S R ; Yang Chen ; Cui Guoxin ; Bian Lifeng ; Yang Hui ; Zhang Yaohui
刊名journal of semiconductors
2010
卷号31期号:3页码:62-65
中文摘要our latest research results on gaas-algaas multiple quantum well spatial light modulators are presented.the thickness uniformity of the epitaxial layers across the 3-inch wafer grown by our molecular beam epitaxy is better than 0.1% and the variation of cavity resonance wavelength within the wafer is only 0.9 nm. a contrast ratio (cr) of 102 by varying bias voltage from 0 to 6.7 v is achieved after fine tuning the cavity by etching an adjust layer. both theoretical and experimental results demonstrate that incorporating an adjust layer is an effective tuning method for obtaining high cr.
学科主题光电子学
收录类别CSCD
资助信息the suzhou international cooperation fund, china,the president fund of cas,the international collaboration plan for science and technology of the chinese ministry of science and technology
语种英语
公开日期2011-08-16
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/21510]  
专题半导体研究所_集成光电子学国家重点实验室
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GB/T 7714
Huang Yuyang,Liu H C,Wasilewski Z R,et al. High contrast ratio, high uniformity multiple quantum well spatial light modulators[J]. journal of semiconductors,2010,31(3):62-65.
APA Huang Yuyang.,Liu H C.,Wasilewski Z R.,Buchanan M.,Laframboise S R.,...&Zhang Yaohui.(2010).High contrast ratio, high uniformity multiple quantum well spatial light modulators.journal of semiconductors,31(3),62-65.
MLA Huang Yuyang,et al."High contrast ratio, high uniformity multiple quantum well spatial light modulators".journal of semiconductors 31.3(2010):62-65.
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