The content calculation of hexagonal phase inclusions in cubic gan films on gaas(001) substrates grown by metalorganic chemical vapor deposition | |
Sun, XL; Wang, YY; Yang, H; Li, JB; Zheng, LX; Xu, DP; Wang, ZG | |
刊名 | Thin solid films |
2000-06-15 | |
卷号 | 368期号:2页码:237-240 |
关键词 | Metalorganic chemical vapor deposition Cubic gan Hexagonal phase content 4-circle x-ray double crystal diffraction |
ISSN号 | 0040-6090 |
通讯作者 | Sun, xl() |
英文摘要 | Cubic gan(c-gan) films are grown on gaas(001) substrates by metalorganic chemical vapor deposition (mocvd). two gan samples were grown with different buffer layer, the deposition time of each was 1 and 3 min, respectively. 4-circle x-ray double crystal diffraction (xrdcd) was used to study the secondary crystallographic phases presented in the c-gan films. the phase composition of the epilayers was determined by x-ray reciprocal space mapping. the intensities of the c-gan(002) and h-gan(10 (1) over bar 1) planes detected in the mapping were investigated by omega scans. the content of the hexagonal phase inclusions in the c-gan films was calculated to about 1.6 and 7.9%, respectively. the thicker buffer layer is not preferable for growing high quality pure c-gan films. (c) 2000 elsevier science s.a. all rights reserved. |
WOS关键词 | MOLECULAR-BEAM EPITAXY ; GALLIUM NITRIDE ; THIN-FILMS ; SILICON ; GAAS |
WOS研究方向 | Materials Science ; Physics |
WOS类目 | Materials Science, Multidisciplinary ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter |
语种 | 英语 |
出版者 | ELSEVIER SCIENCE SA |
WOS记录号 | WOS:000087414100015 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2428881 |
专题 | 半导体研究所 |
通讯作者 | Sun, XL |
作者单位 | 1.Chinese Acad Sci, Inst Semicond, Natl Res Ctr Optoelect Technol, Beijing 100083, Peoples R China 2.Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Sun, XL,Wang, YY,Yang, H,et al. The content calculation of hexagonal phase inclusions in cubic gan films on gaas(001) substrates grown by metalorganic chemical vapor deposition[J]. Thin solid films,2000,368(2):237-240. |
APA | Sun, XL.,Wang, YY.,Yang, H.,Li, JB.,Zheng, LX.,...&Wang, ZG.(2000).The content calculation of hexagonal phase inclusions in cubic gan films on gaas(001) substrates grown by metalorganic chemical vapor deposition.Thin solid films,368(2),237-240. |
MLA | Sun, XL,et al."The content calculation of hexagonal phase inclusions in cubic gan films on gaas(001) substrates grown by metalorganic chemical vapor deposition".Thin solid films 368.2(2000):237-240. |
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