An evidence of defect gettering in gan | |
Majid, Abdul1,2; Ali, Akbar1; Zhu, J. J.2; Wang, Y. T.2; Yang, H.2 | |
刊名 | Physica b-condensed matter |
2008-07-01 | |
卷号 | 403期号:13-16页码:2495-2499 |
关键词 | Gan Impurities Implantation Photoluminescence Gettering |
ISSN号 | 0921-4526 |
DOI | 10.1016/j.physb.2008.01.012 |
通讯作者 | Ali, akbar(akbar@qau.edu.pk) |
英文摘要 | The effect of neon ion implantation on the structural and optical properties of mocvd grown gan was studied. x-ray diffraction and low temperature photoluminescence measurements were carried out on the implanted samples annealed at 900 degrees c. the peak at 3.41 ev exhibited an interesting behavior in as-grown and the implanted samples. annealing has enhanced the intensity of this peak in as-grown samples, but suppressed in all the implanted samples. capturing of defects by cavities during gettering process is interpreted as the reason for the observed behavior of this luminescence peak. implantation dose of 5 x 10(15) ions/cm(2) caused the complete quenching of yellow band luminescence. (c) 2008 elsevier b.v. all rights reserved. |
WOS关键词 | OPTICAL-PROPERTIES ; III-NITRIDES ; LUMINESCENCE ; PHOTOLUMINESCENCE ; IMPLANTATION ; BUBBLES ; EPITAXY ; GROWTH |
WOS研究方向 | Physics |
WOS类目 | Physics, Condensed Matter |
语种 | 英语 |
出版者 | ELSEVIER SCIENCE BV |
WOS记录号 | WOS:000257627300050 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2427488 |
专题 | 半导体研究所 |
通讯作者 | Ali, Akbar |
作者单位 | 1.Quaid I Azam Univ, Adv Mat Phys Lab, Dept Phys, Islamabad, Pakistan 2.Chinese Acad Sci, State Key Lab Integrated Optoelect, Inst Semicond, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Majid, Abdul,Ali, Akbar,Zhu, J. J.,et al. An evidence of defect gettering in gan[J]. Physica b-condensed matter,2008,403(13-16):2495-2499. |
APA | Majid, Abdul,Ali, Akbar,Zhu, J. J.,Wang, Y. T.,&Yang, H..(2008).An evidence of defect gettering in gan.Physica b-condensed matter,403(13-16),2495-2499. |
MLA | Majid, Abdul,et al."An evidence of defect gettering in gan".Physica b-condensed matter 403.13-16(2008):2495-2499. |
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