Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors | |
Yao, Jianke1,2; Fan, Zhengxiu1; He, Hongbo1; Shao, Jianda1 | |
刊名 | Optik |
2009 | |
卷号 | 120期号:11页码:509-513 |
关键词 | Overcoat Tio2/sio2 high reflectors Laser damage |
ISSN号 | 0030-4026 |
DOI | 10.1016/j.ijleo.2007.12.010 |
通讯作者 | Yao, jianke(yjk@siom.ac.cn) |
英文摘要 | Tio2/sio2 high reflectors with and without a sio2 overcoat are deposited by electron-beam evaporation. the film properties are characterized by visible spectrometry measures, structure analysis, roughness and laser-induced damage threshold (lidt) tests, surface defects and damage morphology observation. the effects of overcoats on lidt at 532 nm, 8 ns and 800 nm, 220 ps laser pulses are investigated. the relations between film structure, roughness, surface defects, electric field and lidt are discussed. it is found that overcoats can increase the lidt at these two laser wavelengths. the reduction of peak temperature, the low defects density and roughness, the low intrinsic absorption of sio2 and its amorphous structure are the main reasons for lidt improvement by overcoats. (c) 2008 elsevier gmbh. all rights reserved. |
WOS研究方向 | Optics |
WOS类目 | Optics |
语种 | 英语 |
出版者 | ELSEVIER GMBH, URBAN & FISCHER VERLAG |
WOS记录号 | WOS:000267461900001 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2401103 |
专题 | 中国科学院大学 |
通讯作者 | Yao, Jianke |
作者单位 | 1.Shanghai Inst Opt & Fine Mech, R&D Ctr Opt Thin Film Coatings, Shanghai 201800, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100080, Peoples R China |
推荐引用方式 GB/T 7714 | Yao, Jianke,Fan, Zhengxiu,He, Hongbo,et al. Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors[J]. Optik,2009,120(11):509-513. |
APA | Yao, Jianke,Fan, Zhengxiu,He, Hongbo,&Shao, Jianda.(2009).Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors.Optik,120(11),509-513. |
MLA | Yao, Jianke,et al."Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors".Optik 120.11(2009):509-513. |
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