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	An analysis on damage of light-emitting diodes reliability induced by electronic static discharge
	Nan, Tingting[1]; He, Piaopiao[2]; Yin, Luqiao[3]; Zhang, Jianhua[4]
	2016
会议名称	17th International Conference on Electronic Packaging Technology (ICEPT)
会议日期	2016-08-16
关键词	LED ESD aging reliability
页码	1122-1126
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2235026
专题	上海大学
作者单位	1.[1]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China. 2.Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 3.[2]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China. 4.Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 5.[3]Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 6.Shanghai Univ, Sch Mechatron & Automat, POB 143,149 Yanchang Rd, Shanghai 200072, Peoples R China. 7.[4]Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 8.Shanghai Univ, Sch Mechatron & Automat, POB 143,149 Yanchang Rd, Shanghai 200072, Peoples R China.
推荐引用方式 GB/T 7714	Nan, Tingting[1],He, Piaopiao[2],Yin, Luqiao[3],et al. An analysis on damage of light-emitting diodes reliability induced by electronic static discharge[C]. 见:17th International Conference on Electronic Packaging Technology (ICEPT). 2016-08-16.

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